Publications

Export 4 results:
Author Title Type [ Year(Asc)]
Filters: Author is H. Tokumoto  [Clear All Filters]
1998
Gruverman, A., S.A. Prakash, S. Aggarwal, Ramamoorthy Ramesh, O. Auciello, and H. Tokumoto. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53-58.
Auciello, O., A. Gruverman, H. Tokumoto, S.A. Prakash, S. Aggarwal, and Ramamoorthy Ramesh. "Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films." MRS Bulletin 23 (1998) 33-41.
1997
Gruverman, A., H. Tokumoto, A.S. Prakash, S. Aggarwal, B. Yang, M. Wuttig, Ramamoorthy Ramesh, O. Auciello, and T. Venkatesan. "Nanoscale imaging of domain dynamics and retention in ferroelectric thin films." Applied Physics Letters 71 (1997) 3492-3494.
Gruverman, A., O. Auciello, Ramamoorthy Ramesh, and H. Tokumoto. "Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control." Nanotechnology 8 (1997) A38-A43.