Publications

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Conference Paper
Gruverman, A., S.A. Prakash, S. Aggarwal, Ramamoorthy Ramesh, O. Auciello, and H. Tokumoto. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53-58.
Journal Article
Auciello, O., A. Gruverman, H. Tokumoto, S.A. Prakash, S. Aggarwal, and Ramamoorthy Ramesh. "Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films." MRS Bulletin 23 (1998) 33-41.