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Chalamala, B.R., Y. Wei, R.H. Reuss, S. Aggarwal, B.E. Gnade, Ramamoorthy Ramesh, J.M. Bernhard, E.D. Sosa, and D.E. Golden. "Effect of growth conditions on surface morphology and photoelectric work function characteristics of iridium oxide thin films." Applied Physics Letters 74 (1999) 1394-1396.
.T., Jr., J, L.L. Boyer, G. Velasquez, Ramamoorthy Ramesh, S. Aggarwal, and V. Keramidas. "Effect of hydrogen anneals on niobium-doped lead zirconate titanate capacitors with lanthanum strontium cobalt oxide/platinum electrodes." Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 38 (1999) 5361-5363.
Aggarwal, S., S.R. Perusse, C.W. Tipton, Ramamoorthy Ramesh, H.D. Drew, T. Venkatesan, D.B. Romero, V.B. Podobedov, and A. Weber. "Effect of hydrogen on Pb(Zr,Ti)O3-based ferroelectric capacitors." Applied Physics Letters 73 (1998) 1973-1975.
Nagarajan, V., C.S. Ganpule, B. Nagaraj, S. Aggarwal, S.P. Alpay, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh. "Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films." Applied Physics Letters 75 (1999) 4183-4185.
Madhukar, S., S. Aggarwal, A.M. Dhote, Ramamoorthy Ramesh, A. Krishnan, D. Keeble, and E. Poindexter. "Effect of oxygen stoichiometry on the electrical properties of La0.5Sr0.5CoO3 electrodes." Journal of Applied Physics 81 (1997) 3543-3547.
Alpay, S.P., V. Nagarajan, L.A. Bendersky, M.D. Vaudin, S. Aggarwal, Ramamoorthy Ramesh, and A.L. Roytburd. "Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films." Journal of Applied Physics 85 (1999) 3271-3277.
Tipton, Wesley, K. Kirchner, R. Godfrey, M. Cardenas, S. Aggarwal, H. Li, and Ramamoorthy Ramesh. "Enhanced-response pyroelectric heterostructures." Applied Physics Letters 77 (2000) 2388-2390.
Nagarajan, V., S.P. Alpay, C.S. Ganpule, B. Nagaraj, S. Aggarwal, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh. "Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505-510.
Sadashivan, S., S. Aggarwal, T.K. Song, Ramamoorthy Ramesh, J .T., Jr., B.A. Tuttle, W.L. Warren, and D. Dimos. "Evaluation of imprint in fully integrated (La,Sr)CoO3/Pb(Nb,Zr,Ti)O3/(La,Sr)CoO3 ferroelectric capacitors." Journal of Applied Physics 83 (1998) 2165-2171.