Atomically Resolved Electronic States and Correlated Magnetic Order at Termination Engineered Complex Oxide Heterointerfaces

Publication Type

Journal Article

Authors

Huang, B.-C, P Yu, Y.H Chu, C.-S Chang, Ramamoorthy Ramesh, R.E Dunin-Borkowski, P Ebert, Y.-P Chiu

DOI

Abstract

We map electronic states, band gaps, and interface-bound charges at termination-engineered BiFeO3/La0.7Sr0.3MnO3 interfaces using atomically resolved cross-sectional scanning tunneling microscopy. We identify a delicate interplay of different correlated physical effects and relate these to the ferroelectric and magnetic interface properties tuned by engineering the atomic layer stacking sequence at the interfaces. This study highlights the importance of a direct atomically resolved access to electronic interface states for understanding the intriguing interface properties in complex oxides. © 2018 American Chemical Society.

Journal

ACS Nano

Volume

Year of Publication

2018

ISSN

19360851

Notes

cited By 5

Organization

No Organization

Research Areas

Ramesh Lab