Publications
X Author: K Matsuura
2003
Cho, Y, K Matsuura, N Valanoor, and Ramamoorthy Ramesh."Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy."Ferroelectrics
292 (2003) 171-180. DOI
Matsuura, K, Y Cho, and Ramamoorthy Ramesh."Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy."Applied Physics Letters
83 (2003) 2650-2652. DOI