Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy

Journal Article

Matsuura, K, Y Cho, Ramamoorthy Ramesh

10.1063/1.1609252

The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.

Applied Physics Letters

83

2003

00036951

cited By 20

Ramesh Lab