Publication Type:Journal Article
Source:Applied Physics Letters, Volume 83, Number 13, p.2650-2652 (2003)
Keywords:Dielectric materials, Domain walls, Lead compounds, Microscopic examination, Permittivity, Scanning, thin films
The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.
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