Publication Type:Conference Paper
Source:Ferroelectrics, Volume 292, p.171-180 (2003)
Keywords:180° c-c domain wall, 90° a-c domain wall, crystal structure, Dielectric materials, Ferroelectric materials, Linear dielectric constant, Magnetic domains, Nonlinear dielectric constant, Permittivity, PZT thin films, Scanning nonlinear dielectric microscopy, thin films
Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
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