Publications

X Author: E.H Poindexter

2000

Friessnegg, T, B Nielsen, V.J Ghosh, S Aggarwal, D.J Keeble, E.H Poindexter, and Ramamoorthy Ramesh."Oxygen deficiency and vacancy formation in LSCO/PLZT/LSCO capacitors."Materials Research Society Symposium - Proceedings 596 (2000) 393-397.
Friessnegg, T, S Aggarwal, Ramamoorthy Ramesh, B Nielsen, E.H Poindexter, and D.J Keeble."Vacancy formation in (Pb,La)(Zr,Ti)O3 capacitors with oxygen deficiency and the effect on voltage offset."Applied Physics Letters 77 (2000) 127-129. DOI

1999

Friessnegg, T, B Nielsen, V.J Ghosh, A.R Moodenbaugh, S Madhukar, S Aggarwal, D.J Keeble, E.H Poindexter, P Mascher, and Ramamoorthy Ramesh."Defect identification in (La, Sr)CoO3-δ using positron annihilation spectroscopy."Materials Research Society Symposium - Proceedings 541 (1999) 161-165.
Godfrey, R.P, T Friessnegg, Ramamoorthy Ramesh, C.W Tipton, R.C Huffman, D.N Robertson, E.H Poindexter, M.A Quuada, B Nielsen, and D.J Keeble."Infrared absorbing oxide electrodes in epitaxial pyroelectric Pb-La-Ti-O heterostructures with controlled domain orientation."Integrated Ferroelectrics 25 (1999) 135-147. DOI

1998

Friessnegg, T, S Aggarwal, B Nielsen, Ramamoorthy Ramesh, D.J Keeble, and E.H Poindexter."Investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O3 thin films using positron annihilation."IEEE International Symposium on Applications of Ferroelectrics (1998) 147-150.
Keeble, D.J, A Krishnan, T Friessnegg, B Nielsen, S Madhukar, S Aggarwal, Ramamoorthy Ramesh, and E.H Poindexter."Vacancy defects in thin-film La0.5Sr0.5CoO3-δ observed by positron annihilation."Applied Physics Letters 73 (1998) 508-510. DOI

1997

Keeble, D.J, S Madhukar, B Nielsen, A Krishnan, P Asoka-Kumar, S Aggarwal, Ramamoorthy Ramesh, and E.H Poindexter."Vacancy related defects in La0.5Sr0.5CoO3-δ thin films."Materials Research Society Symposium - Proceedings 477 (1997) 229-233.

1995

Keeble, D.J, A Krishnan, M.T Umlor, K.G Lynn, W.L Warren, D Dimos, B.A Tuttle, Ramamoorthy Ramesh, and E.H Poindexter."Positron annihilation studies of vacancy related defects in ceramic and thin film pb(zr,ti)o3 materials."Integrated Ferroelectrics 8 (1995) 121-128. DOI