Publications
X Author: D.M Gruen
2001
Dhote, A.M, O Auciello, D.M Gruen, and Ramamoorthy Ramesh."Studies of thin film growth and oxidation processes for conductive Ti-Al diffusion barrier layers via in situ surface sensitive analytical techniques."Applied Physics Letters
79 (2001) 800-802. DOI
2000
Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Y Gao, A.H Mueller, and Ramamoorthy Ramesh."Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques."Integrated Ferroelectrics
28 (2000) 1-12. DOI
1999
Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller."Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques."Integrated Ferroelectrics
27 (1999) 103-118. DOI
Dhote, A.M, A.R Krauss, O Auciello, J Im, D.M Gruen, Ramamoorthy Ramesh, S.P Pai, and T Venkatesan."Studies of metallic species incorporation during growth of SrBi2Ta2O9 films on YBa2Cu3O7-x substrates using mass spectroscopy of recoiled ions."Proceedings of the Materials Research Society Symposium -
541 (1999) 281-286.
1998
Im, J, A.R Krauss, A.M Dhote, D.M Gruen, O Auciello, Ramamoorthy Ramesh, and R.P.H Chang."Studies of metallic species and oxygen incorporation during sputter-deposition of SrBi2Ta2O9 films, using mass spectroscopy of recoiled ions."Applied Physics Letters
72 (1998) 2529-2531. DOI