Publications
X Author: A Gruverman
2005
Nagarajan, V, S Aggarwal, A Gruverman, Ramamoorthy Ramesh, and R Waser."Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments."Applied Physics Letters
86 (2005) 1-3. DOI
1998
Gruverman, A, S.A Prakash, S Aggarwal, Ramamoorthy Ramesh, O Auciello, and H Tokumoto."Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy."Proceedings of the Materials Research Society Symposium -
493 (1998) 53-58.
Auciello, O, A Gruverman, H Tokumoto, S.A Prakash, S Aggarwal, and Ramamoorthy Ramesh."Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films."MRS Bulletin
23 (1998) 33-41.
1997
Gruverman, A, H Tokumoto, A.S Prakash, S Aggarwal, B Yang, M Wuttig, Ramamoorthy Ramesh, O Auciello, and T Venkatesan."Nanoscale imaging of domain dynamics and retention in ferroelectric thin films."Applied Physics Letters
71 (1997) 3492-3494. DOI
Gruverman, A, O Auciello, Ramamoorthy Ramesh, and H Tokumoto."Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control."Nanotechnology
8 (1997) A38-A43. DOI