Publication Type:Conference Paper
Source:Materials Research Society Symposium - Proceedings, MRS, Warrendale, PA, United States, Volume 493, p.53-58 (1998)
Keywords:atomic force microscopy, Ferroelectric materials, Grain boundaries, Magnetic domains, nanostructured materials, Polarization, Scanning force microscopy, thin films
Scanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.
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