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Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

Publication Type:

Journal Article

Authors:

O. Auciello; A. Gruverman; H. Tokumoto; S.A. Prakash; S. Aggarwal; Ramamoorthy Ramesh

Source:

MRS Bulletin, Volume 23, Number 1, p.33-41 (1998)

Keywords:

Dielectric films, Ferroelectric materials, Ferroelectric thin films, Microscopic examination, microstructure, piezoelectricity, Polarization, Scanning force microscopy, Surface properties, thin films

Notes:

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