Publications
X Author: A Dhote
2000
Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Y Gao, A.H Mueller, and Ramamoorthy Ramesh."Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques."Integrated Ferroelectrics
28 (2000) 1-12. DOI
1999
Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller."Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques."Integrated Ferroelectrics
27 (1999) 103-118. DOI
Krauss, A.R, A Dhote, O Auciello, J Im, Ramamoorthy Ramesh, and S Aggarwal."Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors."Integrated Ferroelectrics
27 (1999) 147-157. DOI
1998
Li, H, B Yang, A Dhote, S Aggarwal, L Salamanca-Riba, and Ramamoorthy Ramesh."Microstructure investigations and structure-property correlations in ferroelectric thin-film capacitors."Proceedings of the Materials Research Society Symposium -
493 (1998) 171-176.