Publications
X Author: Y Gao
2017
Chen, D, C.T Nelson, X Zhu, C.R Serrao, J.D Clarkson, Z Wang, Y Gao, S.-L Hsu, L.R Dedon, Z Chen, D Yi, H.-J Liu, D Zeng, Y.-H Chu, J F Liu, D.G Schlom, and Ramamoorthy Ramesh."A Strain-Driven Antiferroelectric-to-Ferroelectric Phase Transition in La-Doped BiFeO3 Thin Films on Si."Nano Letters
17 (2017) 5823-5829. DOI
2016
Gao, Y, J.-M Hu, C.T Nelson, T.N Yang, Y Shen, L.Q Chen, Ramamoorthy Ramesh, and C.W Nan."Dynamic in situ observation of voltage-driven repeatable magnetization reversal at room temperature."Scientific Reports
6 (2016). DOI
2015
Zhou, Z, M Trassin, Y Gao, Y Gao, D Qiu, K Ashraf, T Nan, X Yang, S.R Bowden, D.T Pierce, M.D Stiles, J Unguris, M Liu, B.M Howe, G.J Brown, S Salahuddin, Ramamoorthy Ramesh, and N.X Sun."Probing electric field control of magnetism using ferromagnetic resonance."Nature Communications
6 (2015). DOI
2014
Heron, J.T, J.L Bosse, Q He, Y Gao, M Trassin, L Ye, J.D Clarkson, C W Wang, J F Liu, S Salahuddin, D.C Ralph, D.G Schlom, J Íñiguez, B.D Huey, and Ramamoorthy Ramesh."Deterministic switching of ferromagnetism at room temperature using an electric field."Nature
516 (2014) 370-373. DOI
2001
Krauss, A.R, O Auciello, A.M Dhote, J Im, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller."Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties."Integrated Ferroelectrics
32 (2001) 121-131.
2000
Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Y Gao, A.H Mueller, and Ramamoorthy Ramesh."Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques."Integrated Ferroelectrics
28 (2000) 1-12. DOI
1999
Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller."Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques."Integrated Ferroelectrics
27 (1999) 103-118. DOI