Publications

2000

Petit, M, V Nagarajan, S Aggarwal, Ramamoorthy Ramesh, and L.J Martínez-Miranda."Analysis of thin PZT films as a function of depth and thickness by GIXS."Integrated Ferroelectrics 29 (2000) 127-141. DOI

A U.S. Department of Energy National Laboratory Managed by the University of California

Questions & Comments Privacy & Security Notice