Analysis of thin PZT films as a function of depth and thickness by GIXS

Publication Type:

Journal Article

Source:

Integrated Ferroelectrics, Taylor and Francis Inc., Volume 29, Number 1-2, p.127-141 (2000)

Abstract:

We have performed depth profile studies on PZT films of different thickness. Thin epitaxial films of PbZr0.2Ti0.8O3 have been deposited on mono-crystalline (001) LaAlO3 substrate by pulsed laser deposition. Grazing incidence X-ray scattering was used to study the films' structure. GIXS technique was used to analyze the in-plane compression of lattice parameters as a function of depth within the films. © 2000 OPA (Overseas Publishers Association) N.V. Published by license under the Gordon and Breach Science Publishers imprint.

Notes:

cited By 2