Publications

X Author: A.L Roytburd

2000

Nagarajan, V, S.P Alpay, C.S Ganpule, B.K Nagaraj, S Aggarwal, E.D Williams, A.L Roytburd, and Ramamoorthy Ramesh."Role of substrate on the dielectric and piezoelectric behavior of epitaxial lead magnesium niobate-lead titanate relaxor thin films."Applied Physics Letters 77 (2000) 438-440. DOI

1999

Nagarajan, V, C.S Ganpule, B Nagaraj, S Aggarwal, S.P Alpay, A.L Roytburd, E.D Williams, and Ramamoorthy Ramesh."Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films."Applied Physics Letters 75 (1999) 4183-4185. DOI
Alpay, S.P, V Nagarajan, L.A Bendersky, M.D Vaudin, S Aggarwal, Ramamoorthy Ramesh, and A.L Roytburd."Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films."Journal of Applied Physics 85 (1999) 3271-3277. DOI
Alpay, S.P, Ramamoorthy Ramesh, and A.L Roytburd."Effect of uniaxial stress fields on the domain selection of epitaxial ferroelectric films."Ferroelectrics 221 (1999) 245-250. DOI
Alpay, S.P, V Nagarajan, L.A Bendersky, M.D Vaudin, S Aggarwal, Ramamoorthy Ramesh, and A.L Roytburd."The stress state and domain structure of epitaxial PbZr0.2Ti0.8O3 films on (001) SrTiO3 with and without la0.5r0.5CoO3 electrode layer."Materials Research Society Symposium - Proceedings 541 (1999) 357-362.
Nagarajan, V, I.G Jenkins, S.P Alpay, H Li, S Aggarwal, L Salamanca-Riba, A.L Roytburd, and Ramamoorthy Ramesh."Thickness dependence of structural and electrical properties in epitaxial lead zirconate titanate films."Journal of Applied Physics 86 (1999) 595-602. DOI

1998

Alpay, S.P, A.S Prakash, S Aggarwal, P Shuk, M Greenblatt, Ramamoorthy Ramesh, and A.L Roytburd."Polydomain formation in epitaxial PbTiO3 films."Scripta Materialia 39 (1998) 1435-1441. DOI
Alpay, S.P, A.S Prakash, S Aggarwal, Ramamoorthy Ramesh, A.L Roytburd, P Shuk, and M Greenblatt."Polydomain structure of epitaxial PbTiO3 films on MgO."Materials Research Society Symposium - Proceedings 493 (1998) 111-116.