Publications

X Author: A Krishnan

1998

Keeble, D.J, B Nielsen, A Krishnan, K.G Lynn, S Madhukar, Ramamoorthy Ramesh, and C.F Young."Vacancy defects in (Pb, La)(Zr, Ti)O3 capacitors observed by positron annihilation."Applied Physics Letters 73 (1998) 318-320. DOI
Keeble, D.J, A Krishnan, T Friessnegg, B Nielsen, S Madhukar, S Aggarwal, Ramamoorthy Ramesh, and E.H Poindexter."Vacancy defects in thin-film La0.5Sr0.5CoO3-δ observed by positron annihilation."Applied Physics Letters 73 (1998) 508-510. DOI

1997

Madhukar, S, S Aggarwal, A.M Dhote, Ramamoorthy Ramesh, A Krishnan, D Keeble, and E Poindexter."Effect of oxygen stoichiometry on the electrical properties of La0.5Sr0.5CoO3 electrodes."Journal of Applied Physics 81 (1997) 3543-3547. DOI
Keeble, D.J, S Madhukar, B Nielsen, A Krishnan, P Asoka-Kumar, S Aggarwal, Ramamoorthy Ramesh, and E.H Poindexter."Vacancy related defects in La0.5Sr0.5CoO3-δ thin films."Proceedings of the Materials Research Society Symposium - 477 (1997) 229-233.

1995

Keeble, D.J, A Krishnan, M.T Umlor, K.G Lynn, W.L Warren, D Dimos, B.A Tuttle, Ramamoorthy Ramesh, and E.H Poindexter."Positron annihilation studies of vacancy related defects in ceramic and thin film pb(zr,ti)o3 materials."Integrated Ferroelectrics 8 (1995) 121-128. DOI
Krishnan, A, D.J Keeble, Ramamoorthy Ramesh, W.L Warren, B.A Tuttle, R.L Pfeffer, B Nielsen, and K.G Lynn."Vacancy related defects in thin film Pb(ZrTi)O3 materials."Proceedings of the Materials Research Society Symposium - 361 (1995) 129-134.