Publications
X Author: A Stanishefsky
2001
Schmitz, T, K Prume, S Tiedke, A Roelofs, T Schneller, U Kall, M Grossmann, R Waser, C Ganpule, A Stanishefsky, and Ramamoorthy Ramesh."Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors."Integrated Ferroelectrics
37 (2001) 163-172. DOI