Publication Type:
Conference PaperSource:
2015 4th Berkeley Symposium on Energy Efficient Electronic Systems, E3S 2015 - Proceedings, Institute of Electrical and Electronics Engineers Inc. (2015)ISBN:
9781467385688Keywords:
Capacitance, Capacitors, energy efficiency, External resistors, Ferroelectric capacitors, Ferroelectric devices, Ferroelectric switching, ferroelectricity, iron, negative capacitance, Resistors, Semiconductor device measurements, Semiconductor devices, Single-crystalline, Subthreshold characteristics, Switches, Transient analysis, Transistor structureAbstract:
We investigate negative capacitance transients-the time period during ferroelectric switching when the voltage across a ferroelectric changes in a direction opposite to that of the charge-by constructing a simple series network of an isolated single crystalline ferroelectric capacitor and an external resistor. A study of negative capacitance dynamics in such a circuit reveals that the time scale of this phenomenon is controlled by the external resistor rather than by the material dependent intrinsic speeds. As a canonical approach for directly measuring ferroelectric negative capacitance, these experiments could guide the efforts to stabilize negative capacitance in a transistor structure for sub-60 mV/decade subthreshold characteristics as well as help assess negative capacitance response speed at technologically relevant dimensions. © 2015 IEEE.
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