Ultrathin limit of exchange bias coupling at oxide multiferroic/ ferromagnetic interfaces

Publication Type:

Journal Article

Authors:

M. Huijben; P. Yu; L.W. Martin; H.J.A. Molegraaf; Y.-H. Chu; M.B. Holcomb; N. Balke; G. Rijnders; Ramamoorthy Ramesh

Source:

Advanced Materials, Volume 25, Number 34, p.4739-4745 (2013)

Keywords:

Antiferromagnetic orderings, Critical thickness, exchange bias, Exchange bias couplings, Ferromagnetic materials, Ferromagnetism, Ferromagnets, Heterojunctions, Interfaces (materials), Interfacial exchanges, Linear dichroism, Manganese oxide, Multiferroics

Abstract:

Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO3/La0.7Sr0.3MnO3 heterostructures exhibits a critical thickness for ultrathin BiFeO3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Notes:

cited By 41