Ultrathin limit of exchange bias coupling at oxide multiferroic/ ferromagnetic interfaces
Publication Type
Journal Article
Authors
Huijben, M., P. Yu, L.W. Martin, H.J.A. Molegraaf, Y.-H. Chu, M.B. Holcomb, N. Balke, G. Rijnders, Ramamoorthy Ramesh
DOI
Abstract
Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO3/La0.7Sr0.3MnO3 heterostructures exhibits a critical thickness for ultrathin BiFeO3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Journal
Advanced Materials
Volume
25
Year of Publication
2013
ISSN
09359648