Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths

Publication Type:

Journal Article

Authors:

L.V. Saraf; S.E. Lofland; A.V. Cresce; S.M. Bhagat; Ramamoorthy Ramesh

Source:

Applied Physics Letters, Volume 79, Number 3, p.385-387 (2001)

Keywords:

anisotropy, annealing, Barium compounds, Dislocations (crystals), Ferromagnetic resonance, film growth, Magnetocrystalline energy, Magnetoelasticity, Metallic films, pulsed laser deposition, Rutherford backscattering spectroscopy, Strain, surface roughness, thin films, X ray diffraction

Abstract:

Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.

Notes:

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