Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths
Publication Type
Journal Article
Authors
DOI
Abstract
Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.
Journal
Applied Physics Letters
Volume
79
Year of Publication
2001
ISSN
00036951
Notes
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