Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths

Publication Type

Journal Article

Authors

Saraf, L.V, S.E Lofland, A.V Cresce, S.M Bhagat, Ramamoorthy Ramesh

DOI

Abstract

Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.

Journal

Applied Physics Letters

Volume

Year of Publication

2001

ISSN

00036951

Notes

cited By 14

Research Areas

Ramesh Lab