Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Publication Type:

Journal Article

Authors:

H.W. Jang; S.H. Baek; D. Ortiz; C.M. Folkman; R.R. Das; Y.H. Chu; P. Shafer; J.X. Zhang; S. Choudhury; V. Vaithyanathan; Y.B. Chen; D.A. Felker; M.D. Biegalski; M.S. Rzchowski; X.Q. Pan; D.G. Schlom; L.Q. Chen; Ramamoorthy Ramesh; C.B. Eom

Source:

Physical Review Letters, Volume 101, Number 10 (2008)

Keywords:

Epitaxial films, Induced polarization, Polarization, rotation, Spontaneous polarizations, Thermoanalysis, Thick films, thin films

Abstract:

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.

Notes:

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