Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films
Publication Type
Journal Article
Authors
Jang, H.W., S.H. Baek, D. Ortiz, C.M. Folkman, R.R. Das, Y.H. Chu, P. Shafer, J.X. Zhang, S. Choudhury, V. Vaithyanathan, Y.B. Chen, D.A. Felker, M.D. Biegalski, M.S. Rzchowski, X.Q. Pan, D.G. Schlom, L.Q. Chen, Ramamoorthy Ramesh, C.B. Eom
DOI
Abstract
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.
Journal
Physical Review Letters
Volume
101
Year of Publication
2008
ISSN
00319007