Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Publication Type:

Journal Article

Source:

Physical Review Letters, Volume 101, Number 10 (2008)

Abstract:

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.

Notes:

cited By 186