Size effects in ultrathin epitaxial ferroelectric heterostructures
Publication Type
Journal Article
Authors
Nagarajan, V, S Prasertchoung, T Zhao, H Zheng, J Ouyang, Ramamoorthy Ramesh, W Tian, X.Q Pan, D.M Kim, C.B Eom, H Kohlstedt, R Waser
DOI
Abstract
The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.
Journal
Applied Physics Letters
Volume
84
Year of Publication
2004
ISSN
00036951
Notes
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