Size effects in ultrathin epitaxial ferroelectric heterostructures
Nagarajan, V., S. Prasertchoung, T. Zhao, H. Zheng, J. Ouyang, Ramamoorthy Ramesh, W. Tian, X.Q. Pan, D.M. Kim, C.B. Eom, H. Kohlstedt, R. Waser
The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.
Applied Physics Letters
Year of Publication