Size effects in ultrathin epitaxial ferroelectric heterostructures

Journal Article

Nagarajan, V, S Prasertchoung, T Zhao, H Zheng, J Ouyang, Ramamoorthy Ramesh, W Tian, X.Q Pan, D.M Kim, C.B Eom, H Kohlstedt, R Waser

10.1063/1.1765742

The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.

Applied Physics Letters

84

2004

00036951

cited By 92

Ramesh Lab