Polarization switching of submicron ferroelectric capacitors using an atomic force microscope
Publication Type
Journal Article
Authors
DOI
Abstract
The measurement of switchable pulse polarization of micron and submicron ferroelectric capacitors was discussed, using pulse switching and atomic force microscope (AFM). The measurement setup for pulsed probing to measure the switchable polarization of a submicron capacitor was a combination of a pulse generator, an AFM, a shunt resistor, and a digital sampling oscilloscope. The switchable polarization of discrete polycrystalline Pb(ZrTi)O 3 capacitors were obtained using fast square pulses with rise time on the order of tens of nanaoseconds. The results show that switchable polarization is independent of the pulse width within experimental error.
Journal
Applied Physics Letters
Volume
84
Year of Publication
2004
ISSN
00036951
Notes
cited By 13