Publication Type:
Journal ArticleSource:
Applied Physics Letters, Volume 87, Number 25, p.1-3 (2005)Keywords:
bismuth compounds, electron microscopy, Epitaxial growth, Ferroelectric domain structure, ferroelectricity, Piezoelectric force microscopy, Piezoresponse data, Polarization, polarization switching, Strontium compounds, thin films, VectorsAbstract:
Ferroelectric domain structure and polarization switching in an epitaxial BiFe O3 film grown on a 0.8° miscut SrTi O3 (001) substrate were studied by piezoelectric force microscopy. The film shows a two-domain stripe pattern, with the polarization vectors oriented along two 〈111〉 axes which form an angle of 71°. Polarization switching was investigated by locally poling the film. By combining the perpendicular and in-plane piezoresponse data we found that polarization rotates by 71° and 109°, while 180° switching is mainly observed at low fields. © 2005 American Institute of Physics.
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