Publication Type:Journal Article
Source:Applied Physics Letters, Volume 87, Number 25, p.1-3 (2005)
Keywords:bismuth compounds, electron microscopy, Epitaxial growth, Ferroelectric domain structure, ferroelectricity, Piezoelectric force microscopy, Piezoresponse data, Polarization, polarization switching, Strontium compounds, thin films, Vectors
Ferroelectric domain structure and polarization switching in an epitaxial BiFe O3 film grown on a 0.8° miscut SrTi O3 (001) substrate were studied by piezoelectric force microscopy. The film shows a two-domain stripe pattern, with the polarization vectors oriented along two 〈111〉 axes which form an angle of 71°. Polarization switching was investigated by locally poling the film. By combining the perpendicular and in-plane piezoresponse data we found that polarization rotates by 71° and 109°, while 180° switching is mainly observed at low fields. © 2005 American Institute of Physics.
cited By 102