Polarization switching in epitaxial BiFeO 3 films

Publication Type:

Journal Article

Authors:

F. Zavaliche; P. Shafer; Ramamoorthy Ramesh; M.P. Cruz; R.R. Das; D.M. Kim; C.B. Eom

Source:

Applied Physics Letters, Volume 87, Number 25, p.1-3 (2005)

Keywords:

bismuth compounds, electron microscopy, Epitaxial growth, Ferroelectric domain structure, ferroelectricity, Piezoelectric force microscopy, Piezoresponse data, Polarization, polarization switching, Strontium compounds, thin films, Vectors

Abstract:

Ferroelectric domain structure and polarization switching in an epitaxial BiFe O3 film grown on a 0.8° miscut SrTi O3 (001) substrate were studied by piezoelectric force microscopy. The film shows a two-domain stripe pattern, with the polarization vectors oriented along two 〈111〉 axes which form an angle of 71°. Polarization switching was investigated by locally poling the film. By combining the perpendicular and in-plane piezoresponse data we found that polarization rotates by 71° and 109°, while 180° switching is mainly observed at low fields. © 2005 American Institute of Physics.

Notes:

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