Publication Type:Conference Paper
Source:Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC, IEEE, Piscataway, NJ, United States, p.32-33 (1998)
Keywords:Electric field effects, electron emission, Field emission cathodes, Lanthanum, Lead compounds, Molybdenum, Molybdenum emitter tips, oxides, Photoelectric workfunctions, Photoemission, Strontium compounds, Thin film devices, Ultraviolet spectroscopy, X ray diffraction analysis, X ray photoelectron spectroscopy
Photoelectric work functions of flat thin metal oxides are presented as potential field emission sources for field emission displays are measured using ultraviolet spectroscopy. The samples which include Mo, La, strontium cobalt oxide, lead zirconium titanate, lead niobium zirconium titanate are characterized with X-ray photoelectron spectroscopy and X-ray diffraction spectroscopy. Field emission measurements are made with Mo and Mo coated field emission tips using single tip-gated aperture diodes mounted on a micromechanical motion control system.
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