Publication Type:Journal Article
Source:Journal of Microscopy, Volume 202, Number 1, p.250-254 (2001)
Keywords:atomic force microscopy, comparative study, conference paper, film, imaging, lead, optical resolution, oxide, priority journal, scanning near field optical microscopy, structure analysis, titanium derivative, X ray diffraction, zirconium
Near-field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1-xO3 thin films in the 0 < x < 0.4 range. Comparison of the near-field optical images and the results of atomic force microscopy and X-ray diffraction studies show that an optical resolution of the order of 100 nm is achieved. Symmetry properties of the near-field second harmonic signal allow us to obtain good optical contrast between the local second harmonic generation in c- and a-domains. Experimentally measured near-field second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment is demonstrated.
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