Microstructure of epitaxial oxide thin film heterostructures on silicon by pulsed laser deposition

Publication Type

Journal Article

Authors

DOI

Abstract

The microstructure of epitaxial La0.5Sr0.5CoO 3(LSCO)/ferroelectric lanthanum modified lead zirconate titanate (PLZT)/ La0.5Sr0.5CoO3(LSCO)/bismuth titanate(BT)/yttria-stabilized zirconia (YSZ) heterostructures on [001] silicon has been investigated. X-ray diffraction and pole figure analysis reveal epitaxial growth of the PLZT, LSCO, BT, and YSZ layers. High resolution transmission electron microscopy was done to study the crystal defects and interfacial structure.

Journal

Applied Physics Letters

Volume

64

Year of Publication

1994

ISSN

00036951

Research Areas