Measurement of internal stresses via the polarization in epitaxial ferroelectric films

Publication Type:

Journal Article

Authors:

A.L. Roytburd; S.P. Alpay; V. Nagarajan; C.S. Ganpule; S. Aggarwal; E.D. Williams; Ramamoorthy Ramesh

Source:

Physical Review Letters, American Inst of Physics, Woodbury, NY, United States, Volume 85, Number 1, p.190-193 (2000)

Keywords:

Dielectric susceptibility, Differential equations, Elastic strain tensor, elasticity, electrodes, Epitaxial growth, Ferroelectric devices, Ferroelectric films, Free energy, internal stresses, Permittivity, Polarization, substrates, thin films

Abstract:

A study was carried out with the aim of formulating an approach to determine internal stresses in the constrained ferroelectric (FE) films using its electrical and electromechanical characteristics. As a first step, an attempt was made to clarify the theoretical background for electromechanical properties of constrained FE films. Following this, available experimental work was analyzed from this point of view. Overall, it was confirmed that the mechanical characteristics of the films can be determined through the electric response of constrained films.

Notes:

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