Publication Type:Journal Article
Source:Applied Physics Letters, American Institute of Physics Inc., Woodbury, Volume 75, Number 13, p.1947-1948 (1999)
Keywords:Dielectric films, Epitaxial growth, Ferromagnetic resonance, Ferromagnetic resonance microscopy, lanthanum compounds, Lanthanum strontium manganate, Microscopic examination, Perovskite, thin films
A simple ferromagnetic resonance (FMR) microscope was constructed for analyzing the magnetic properties of thin films of a prototypical colossal magnetoresistance (CMR) manganite, La0.7Sr0.3MnO3. From the 300 K scans, the films show tremendous strains. However, in the best films, the strain is relatively uniform. Unfortunately, on cooling, the FMR spectrum degrades rapidly.
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