Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
Publication Type
Conference Paper
Authors
Abstract
Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.
Journal
IEEE International Symposium on Applications of Ferroelectrics
Year of Publication
1994