Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes

Conference Paper

Benedetto, J.M, M.L Roush, I.K Lloyd, Ramamoorthy Ramesh

Anon, Anon

Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.

IEEE International Symposium on Applications of Ferroelectrics

1994

cited By 7

Ramesh Lab