Publication Type:Conference Paper
Source:IEEE International Symposium on Applications of Ferroelectrics, IEEE, Piscataway, NJ, United States, p.66-69 (1994)
Keywords:Capacitors, electrodes, Ferroelectric imprint, Ferroelectric materials, Lanthanum strontium cobalt oxide, Lead compounds, Lead lanthanum zirconate titanate, measurements, oxides, Polarization, stresses, Thermal effects, thin films, Voltage stress
Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.
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