Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes

Publication Type:

Conference Paper

Authors:

J.M. Benedetto; M.L. Roush; I.K. Lloyd; Ramamoorthy Ramesh

Source:

IEEE International Symposium on Applications of Ferroelectrics, IEEE, Piscataway, NJ, United States, p.66-69 (1994)

Keywords:

Capacitors, electrodes, Ferroelectric imprint, Ferroelectric materials, Lanthanum strontium cobalt oxide, Lead compounds, Lead lanthanum zirconate titanate, measurements, oxides, Polarization, stresses, Thermal effects, thin films, Voltage stress

Abstract:

Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.

Notes:

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