Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Publication Type:

Journal Article

Source:

Applied Physics Letters, American Institute of Physics Inc., Volume 104, Number 23 (2014)

Abstract:

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contact-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. © 2014 AIP Publishing LLC.

Notes:

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