Publication Type:Journal Article
Source:Applied Physics Letters, Volume 84, Number 14, p.2626-2628 (2004)
Keywords:Capacitors, Computer simulation, elasticity, electrodes, Epitaxial heterostructures, Ferroelectric thin films, Finite element method, Heterojunctions, Mathematical models, Nanostructured ferroelectric films, nanostructured materials, Piezoresponse, scanning electron microscopy, Semiconducting lead compounds, Single crystals, Strontium compounds
The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.
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