Finite element modeling of piezoresponse in nanostructured ferroelectric films

Publication Type

Journal Article

Authors

DOI

Abstract

The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.

Journal

Applied Physics Letters

Volume

84

Year of Publication

2004

ISSN

00036951

Research Areas