Publication Type:Journal Article
Source:Applied Physics Letters, Volume 87, Number 18, p.1-3 (2005)
Keywords:bismuth compounds, Cantilever beams, crystal structure, Crystallography, Ferroelectric domain structure, ferroelectricity, film growth, In-plane piezoresponse, Light polarization, Piezoelectric force microscopy, Polarization direction
Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600 nm thick epitaxial BiFe O3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. © 2005 American Institute of Physics.
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