Ferroelectric domain structure in epitaxial BiFeO 3 films

Journal Article

Zavaliche, F., R.R. Das, D.M. Kim, C.B. Eom, S.Y. Yang, P. Shafer, Ramamoorthy Ramesh

10.1063/1.2126804

Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600 nm thick epitaxial BiFe O3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. © 2005 American Institute of Physics.

Applied Physics Letters

87

2005

00036951

Ramesh Lab