Publication Type:Conference Paper
Source:Proceedings - Annual Meeting, Microscopy Society of America, p.572-573 (1994)
Keywords:bismuth compounds, Crystal defects, Crystal microstructure, Crystals, Epitaxial growth, Ferroelectric materials, Ferroelectric thin films, High resolution transmission electron microscopy, lanthanum compounds, Lead compounds, Phase interfaces, Semiconducting films, Semiconducting silicon compounds, thin films, transmission electron microscopy
Microstructure of epitaxial ferroelectric/conductive oxide heterostructures on LaAlO3 (LAO) and Si substrates have been studied by conventional and high resolution transmission electron microscopy. The epitaxial films have a wide range of potential applications in areas such as non-volatile memory devices, electro-optic devices and pyroelectric detectors.
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