Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy

Publication Type

Conference Paper

Authors

Abstract

Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.

Journal

OSA Trends in Optics and Photonics Series

Volume

88

Year of Publication

2003

ISSN

10945695

Notes

cited By 0

Research Areas