Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy
Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.
OSA Trends in Optics and Photonics Series
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