Diagnostics of "colossal" magnetoresistance manganite films by Raman spectroscopy
Podobedov, V.B., D.B. Romero, A. Weber, J.P. Rice, R. Schreekala, M. Rajeswari, Ramamoorthy Ramesh, T. Venkatesan, H.D. Drew
Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown" films compared to those annealed in oxygen at 800°C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found. © 1998 American Institute of Physics.
Applied Physics Letters
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