Publication Type:Conference Paper
Source:IEEE International Symposium on Applications of Ferroelectrics, Volume 1 (2008)
Keywords:Coercive voltages, Do-mains, Ferroelectric films, Ferroelectric materials, Ferroelectric thin films, lead, Nano dots, Retention properties, thin films, zirconium
Retention properties of written nanodots for Pb(Zr0.2Ti 0.8)O3 have been investigated. The imaging voltage plays an important role when investigating small unstable domains. Even with an imaging voltage far below the coercive voltage the boundaries of the domains are switched during imaging by what the measured nanodomain stability is strongly influenced.
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