Publication Type:Journal Article
Source:Applied Physics Letters, American Institute of Physics Inc., Volume 104, Number 8 (2014)
Keywords:Aluminum compounds, Backscattering, bismuth compounds, Crystalline orientations, Electron backscattering diffraction, Electronic properties, High-throughput synthesis, iron compounds, lanthanum compounds, manganese compounds, Piezoforce microscopy, Polycrystalline substrates, pulsed laser deposition, Relative orientation, sintering, Strontium compounds, Substrate grains, substrates, Surface normals, thin films
Multiferroic BiFeO3 (BFO)/La0.7Sr 0.3MnO3 heterostructured thin films were grown by pulsed laser deposition on polished spark plasma sintered LaAlO3 (LAO) polycrystalline substrates. Both polycrystalline LAO substrates and BFO films were locally characterized using electron backscattering diffraction, which confirmed the high-quality local epitaxial growth on each substrate grain. Piezoforce microscopy was used to image and switch the piezo-domains, and the results are consistent with the relative orientation of the ferroelectric variants with the surface normal. This high-throughput synthesis process opens the routes towards wide survey of electronic properties as a function of crystalline orientation in complex oxide thin film synthesis. © 2014 AIP Publishing LLC.
cited By 11