Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

Publication Type:

Journal Article

Source:

Advanced Materials, Volume 23, Number 21, p.2474-2479 (2011)

Abstract:

Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Notes:

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