Atomic structure of highly strained BiFeO 3 thin films
Rossell, M.D., R. Erni, M.P. Prange, J.-C. Idrobo, W. Luo, R.J. Zeches, S.T. Pantelides, Ramamoorthy Ramesh
We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.
Physical Review Letters
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