Publication Type:Journal Article
Source:Physical Review Letters, Volume 108, Number 4 (2012)
Keywords:Atomic spectroscopy, Atomic-resolution, Atoms, bismuth, Direct imaging, dissociation, Electron energy levels, Electron energy loss spectroscopy, Electron scattering, Electronic structure, Fe atoms, Highly strained, Multiferroics, R phase, scanning transmission electron microscopy, Spontaneous polarizations, T-phase, thin films, transmission electron microscopy
We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.
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