Atomic structure of highly strained BiFeO 3 thin films

Publication Type

Journal Article

Authors

DOI

Abstract

We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.

Journal

Physical Review Letters

Volume

108

Year of Publication

2012

ISSN

00319007

Notes

cited By 79

Research Areas