Export 3 results:[ Author] Title Type Year
Filters: First Letter Of Last Name is G and Author is A. Gruverman [Clear All Filters]
"Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53-58..
"Nanoscale imaging of domain dynamics and retention in ferroelectric thin films." Applied Physics Letters 71 (1997) 3492-3494..
"Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control." Nanotechnology 8 (1997) A38-A43..