Publications
"Defect identification in (La, Sr)CoO3-δ using positron annihilation spectroscopy." Materials Research Society Symposium - Proceedings. Vol. 541. 1999. 161-165.
. "Vacancy related defects in La0.5Sr0.5CoO3-δ thin films." Materials Research Society Symposium - Proceedings. Vol. 477. MRS, Warrendale, PA, United States, 1997. 229-233.
. "Can lead nonstoichiometry influence ferroelectric properties of Pb(Zr,Ti)O3 thin films?." Applied Physics Letters 75 (1999) 716-718.
"Direct integration of ferroelectric La-Sr-Co-O/Pb-Nb-Zr-Ti-O/La-Sr-Co-O capacitors on silicon with conducting barrier layers." Applied Physics Letters (1995) 1350.
. "Direct integration of ferroelectric La-Sr-Co-O/Pb-Nb-Zr-Ti-O/La-Sr-Co-O capacitors on silicon with conducting barrier layers." Applied Physics Letters 68 (1996) 1350-1352.
. "Dynamics of polarization loss in (Pb, La)(Zr, Ti)O3 thin film capacitors." Applied Physics Letters 72 (1998) 3300-3302.
. "Effect of oxygen stoichiometry on the electrical properties of La0.5Sr0.5CoO3 electrodes." Journal of Applied Physics 81 (1997) 3543-3547.
. "Low temperature growth and reliability of ferroelectric memory cell integrated on Si with conducting barrier stack." Journal of Materials Research 12 (1997) 1589-1594.
. "Pulsed laser-ablation deposition of thin films of molybdenum suicide and its properties as a conducting barrier for ferroelectric random-access memory technology." Journal of Materials Research 14 (1999) 940-947.
. "Rapid thermal annealing of oxide electrodes for nonvolatile ferroelectric memory structures." Journal of Electroceramics 2 (1998) 171-179.
. "Vacancy defects in (Pb, La)(Zr, Ti)O3 capacitors observed by positron annihilation." Applied Physics Letters 73 (1998) 318-320.
. "Vacancy defects in thin-film La0.5Sr0.5CoO3-δ observed by positron annihilation." Applied Physics Letters 73 (1998) 508-510.
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