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Filters: Author is T. Schneller [Clear All Filters]
"Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope." Applied Physics Letters 79 (2001) 3678-3680..
"Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors." Integrated Ferroelectrics. Vol. 37. 2001. 163-172..