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Conference Paper
Gruverman, A., S.A. Prakash, S. Aggarwal, Ramamoorthy Ramesh, O. Auciello, and H. Tokumoto. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53-58.