Publications

Export 4 results:
Author Title [ Type(Asc)] Year
Filters: Author is A. Dhote  [Clear All Filters]
Journal Article
Auciello, O., A.R. Krauss, J. Im, A. Dhote, D.M. Gruen, E.A. Irene, Y. Gao, A.H. Mueller, and Ramamoorthy Ramesh. "Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques." Integrated Ferroelectrics 28 (2000) 1-12.
Conference Paper
Krauss, A.R., A. Dhote, O. Auciello, J. Im, Ramamoorthy Ramesh, and S. Aggarwal. "Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 147-157.
Auciello, O., A.R. Krauss, I.M. Jaemo, A. Dhote, D.M. Gruen, S. Aggarwal, Ramamoorthy Ramesh, E.A. Irene, Y. Gao, and A.H. Mueller. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103-118.
Li, H., B. Yang, A. Dhote, S. Aggarwal, L. Salamanca-Riba, and Ramamoorthy Ramesh. "Microstructure investigations and structure-property correlations in ferroelectric thin-film capacitors." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 171-176.