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A. Stanishefsky
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2001
Schmitz, T.
,
K. Prume
,
S. Tiedke
,
A. Roelofs
,
T. Schneller
,
U. Kall
,
M. Grossmann
,
R. Waser
,
C. Ganpule
,
A. Stanishefsky
, and
Ramamoorthy Ramesh
.
"
Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors
."
Integrated Ferroelectrics
. Vol. 37. 2001. 163-172.
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