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2001
Schmitz, T., K. Prume, S. Tiedke, A. Roelofs, T. Schneller, U. Kall, M. Grossmann, R. Waser, C. Ganpule, A. Stanishefsky, and Ramamoorthy Ramesh. "Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors." Integrated Ferroelectrics. Vol. 37. 2001. 163-172.