Publications
"Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films." Journal of Applied Physics 92 (2002) 6762-6767.
. "Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories." Acta Materialia 48 (2000) 3387-3394.
. "Conducting diffusion barriers for integration of ferroelectric capacitors on Si." Integrated Ferroelectrics 25 (1999) 205-221.
"Conducting barriers for vertical integration of ferroelectric capacitors on Si." Applied Physics Letters 74 (1999) 230-232.
. "Can lead nonstoichiometry influence ferroelectric properties of Pb(Zr,Ti)O3 thin films?." Applied Physics Letters 75 (1999) 716-718.
"(Ba,Sr)TiO3 thin films with conducting perovskite electrodes for dynamic random access memory applications." Applied Physics Letters 74 (1999) 3194-3196.
. "Analysis of thin PZT films as a function of depth and thickness by GIXS." Integrated Ferroelectrics 29 (2000) 127-141.
. "Activation fields in ferroelectric thin film capacitors: Area dependence." Applied Physics Letters 73 (1998) 3366-3368.
"Activation field of ferroelectric (Pb,La)(Zr,Ti)O3 thin film capacitors." Applied Physics Letters 71 (1997) 2211-2213.
. "Vacancy related defects in La0.5Sr0.5CoO3-δ thin films." Materials Research Society Symposium - Proceedings. Vol. 477. MRS, Warrendale, PA, United States, 1997. 229-233.
. "Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 147-157.
. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103-118.
. "The stress state and domain structure of epitaxial PbZr0.2Ti0.8O3 films on (001) SrTiO3 with and without la0.5r0.5CoO3 electrode layer." Materials Research Society Symposium - Proceedings. Vol. 541. 1999. 357-362.
. "Room temperature thin film BaxSr1-xTiO3 Ku-band coupled microstrip phase shifters: effects of film thickness, doping, annealing and substrate choice." IEEE MTT-S International Microwave Symposium Digest. Vol. 2. IEEE, Piscataway, NJ, United States, 1999. 737-740.
. "Polydomain structure of epitaxial PbTiO3 films on MgO." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 111-116.
. "Photoelectric workfunctions of metals oxide films and emission characteristics of molybdenum emitter tips with oxide coatings." Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC. IEEE, Piscataway, NJ, United States, 1998. 32-33.
. "Oxygen deficiency and vacancy formation in LSCO/PLZT/LSCO capacitors." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 393-397.
. "Oxidation of molybdenum thin films and its impact on molybdenum field emitter arrays." Materials Research Society Symposium Proceedings. Vol. 685. 2001. 353-358.
. "Near-field second-harmonic microscopy of thin ferroelectric films." Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series. IEEE, Piscataway, NJ, United States, 2000. 63.
. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53-58.
. "Microstructure investigations and structure-property correlations in ferroelectric thin-film capacitors." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 171-176.
. "Investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O3 thin films using positron annihilation." IEEE International Symposium on Applications of Ferroelectrics. IEEE, Piscataway, NJ, United States, 1998. 147-150.
. "Ferroelectric tunable microstrip Lange coupler for K-band applications." IEEE MTT-S International Microwave Symposium Digest. Vol. 3. 2000. 1363-1366.
. "Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505-510.
. "Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes." Integrated Ferroelectrics. Vol. 46. 2002. 295-306.
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