Publications
"Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories." Acta Materialia 48 (2000) 3387-3394.
. "Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films." Journal of Applied Physics 92 (2002) 6762-6767.
. "Dynamics of polarization loss in (Pb, La)(Zr, Ti)O3 thin film capacitors." Applied Physics Letters 72 (1998) 3300-3302.
. "Effect of growth conditions on surface morphology and photoelectric work function characteristics of iridium oxide thin films." Applied Physics Letters 74 (1999) 1394-1396.
. "Effect of hydrogen anneals on niobium-doped lead zirconate titanate capacitors with lanthanum strontium cobalt oxide/platinum electrodes." Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 38 (1999) 5361-5363.
. "Effect of hydrogen on Pb(Zr,Ti)O3-based ferroelectric capacitors." Applied Physics Letters 73 (1998) 1973-1975.
. "Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films." Applied Physics Letters 75 (1999) 4183-4185.
. "Effect of oxygen stoichiometry on the electrical properties of La0.5Sr0.5CoO3 electrodes." Journal of Applied Physics 81 (1997) 3543-3547.
. "Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films." Journal of Applied Physics 85 (1999) 3271-3277.
. "Enhanced-response pyroelectric heterostructures." Applied Physics Letters 77 (2000) 2388-2390.
. "Evaluation of imprint in fully integrated (La,Sr)CoO3/Pb(Nb,Zr,Ti)O3/(La,Sr)CoO3 ferroelectric capacitors." Journal of Applied Physics 83 (1998) 2165-2171.
. "Focused ion-beam patterning of nanoscale ferroelectric capacitors." Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 16 (1998) 3899-3902.
. "Growth and characterization of self assembled palladium oxide nanostructures." Materials Research Society Symposium - Proceedings 666 (2001) F511-F5110.
. "High density ferroelectric memories: Materials, processing and scaling." Integrated Ferroelectrics 28 (2000) 213-225.
. "Hysteresis relaxation in (Pb,La)(Zr,Ti)O3 thin film capacitors with (La,Sr)CoO3 electrodes." Applied Physics Letters 69 (1996) 2540-2542.
"Influence of contact electrodes on leakage characteristics in ferroelectric thin films." Journal of Applied Physics 90 (2001) 375-382.
. "A Ku-band gold/BaxSr1-xTiO3/LaAlO3 conductor/thin-film ferroelectric microstrip line phase shifter for room-temperature communications applications." Microwave and Optical Technology Letters 20 (1999) 53-56.
. "La0.5Sr0.5CoO3/Pb(Nb0.04Zr 0.28Ti0.68)O3/La0.5Sr 0.5CoO3 thin film heterostructures on Si using TiN/Pt conducting barrier." Applied Physics Letters 71 (1997) 356-358.
. "Lead based ferroelectric capacitors for low voltage non-volatile memory applications." Integrated Ferroelectrics 19 (1998) 159-177.
. "Leakage current mechanisms in lead-based thin-film ferroelectric capacitors." Physical Review B - Condensed Matter and Materials Physics 59 (1999) 16022-16027.
. "Low voltage performance of Pb(Zr, Ti)O3 capacitors through donor doping." Applied Physics Letters 71 (1997) 3578-3580.
. "Low-temperature integration of lead-based ferroelectric capacitors on Si with diffusion barrier layer." Applied Physics Letters 80 (2002) 3599-3601.
. "Measurement of internal stresses via the polarization in epitaxial ferroelectric films." Physical Review Letters 85 (2000) 190-193.
. "Nanoscale imaging of domain dynamics and retention in ferroelectric thin films." Applied Physics Letters 71 (1997) 3492-3494.
. "Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments." Applied Physics Letters 86 (2005) 1-3.
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